| Title | : | VLSI Design and Test |
|---|---|---|
| Author | : | Brajesh Kumar Kaushik, Sudeb Dasgupta & Virendra Singh |
| Release | : | 2017-12-21 |
| Kind | : | ebook |
| Genre | : | Computers, Books, Computers & Internet, Network |
| Size | : | 18928923 |
| This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. |
